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A Study on Low Light Level CCD Noise Test.

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

Issue:
1994年03期
Page:
54-56
Research Field:
Publishing date:

Info

Title:
A Study on Low Light Level CCD Noise Test.
Author(s):
Bai Lianfa
School of Electronic Engineering and Optoelectronic Technology,NUST, Nanjing 210094),et al..
Keywords:
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PACS:
TB52
DOI:
-
Abstract:
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References:

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Memo

Memo:
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Last Update: 2013-04-22