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A Surface Analysis of Microchannel Plate in Gen Ⅱ Image Intensifier Tubes by XPS(PDF)

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

Issue:
1998年02期
Page:
57-60
Research Field:
Publishing date:

Info

Title:
A Surface Analysis of Microchannel Plate in Gen Ⅱ Image Intensifier Tubes by XPS
Author(s):
Che Jing Yang Weiyi Li Xiaofeng Chang Benkang
School of Electronic Engineering and Optoelectronic Technology,NUST, Nanjing 210094
Keywords:
image int ens if ier microchannel plat e energy spect rum analys is XPS
PACS:
TN144
DOI:
-
Abstract:
In order t o improve the noise propert ies and the product ivity of Gen Ⅱ image intensifier tubes, an XPS analysis on the elect rode surface of microchannel plat e ( MCP ) in Gen Ⅱ invert er and wafer is studied. Af ter 3 min splash of Ar+ , there is nearly no sodium ( Na) and potass ium ( K) on the MCP surface of wafer, but on that of invert er, the concentrat ion of Na is 5. 64%, K is 2. 16 %, and on both MCP surfaces the spect rum of lead ( Pb) is found. T he researched results show the s orption of alkali met al vapors and the segregat ion of Pb f rom MCP interior to the elect rode surface are one of import ant background noise sources of Gen Ⅱ image intensifier tubes .

References:

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Last Update: 2013-03-29