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Testing of Spectral Sensitivity of Semiconductor Photodetectors(PDF)

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

Issue:
1999年02期
Page:
37-40
Research Field:
Publishing date:

Info

Title:
Testing of Spectral Sensitivity of Semiconductor Photodetectors
Author(s):
Liu Hui Zhu Rihong Zhu Yu Chen Jinbang
School of Electronic Engineering and Optoelectric Technology,NUST,Nanjing210094
Keywords:
relat ive spect ral sensitivity absolute spectral sensit iv ity quantum ef ficiency monochromators error analysis
PACS:
TN206
DOI:
-
Abstract:
Analytical research is made in this paper on the testing principle of the spectral sensit ivity of semiconductor photodetectors. A device using a double optical path system is developed to test the spectral sensitivity w ith w avelength ranging f rom 0.4 to 1.1 μm. T his device can be used to test the relat ive spect ral sensit iv ity, the absolute spectral sensitivity, the quantum efficiency and eliminate the effect of unstability of source on test result s.

References:

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2 吴继宗, 鹿景荣, 张风宏. 光电探测器相对光谱灵敏度测试方法的研究1 光学学报, 1989, 9( 8) : 758~ 761
3 Budde W. Optical radiatio n measurement volume 4 physical detectors of optical radiatio n1 New York: Academic Pr ess, 19831 50~ 52
4 Eppeldauer G1Relative spectral sensitivity distribution measurement of photoreceivers1 Appl Opt,1997, 16( 1) : 256~ 258

Memo

Memo:
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Last Update: 2013-03-29