|Table of Contents|

Study on Accelerated Life Test of Function Degenerating Type by Temperature Stress(PDF)

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

Issue:
2000年06期
Page:
523-527
Research Field:
Publishing date:

Info

Title:
Study on Accelerated Life Test of Function Degenerating Type by Temperature Stress
Author(s):
JiangRenyuan ZhangXingtang YangYichun
School of Mechanics,NUST,Nanjing 210094
Keywords:
failure mechanism accelerated life test simulation
PACS:
TJ430
DOI:
-
Abstract:
This paper studied reliability of radio fuze for long t ime storage. Because parameters of electronic component are changed w ith storage time, the funct ion degenerat ing type accelerated life test model is established and built by temperature st ress. According to the result of accelerated life test, the performance variation law of electronic components in common cond-i t ion is deduced, and the accelerated life factor is derived f rom Arrhenius model. Furthermore, this paper studied accelerated factor and act ivat ion energy, deduced accelerated factor and calculat ional formula of activat ion energy by several kinds of familiar funct ion degenerat ing law such as linear function, ex ponent ial function and idempotent funct ion, and then calculated the product ion. s integrated act ivat ion energy by example.

References:

1 [ 日] 盐见·弘. 失效物理基础. 杨家铿译. 北京: 科学出版社, 1982
2 胡昌寿. 可靠性工程设计——试验、分析、管理. 北京: 宇航出版社, 1989
3 周源泉. 论加速系数与失效机理不变的条件( Ⅳ) ——寿命型随机变量的情况. 系统工程与电子技术, 1996( 1) : 55~ 66

Memo

Memo:
-
Last Update: 2013-03-25