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Bias Voltage Numerical Analysis of Uncooled Thermal Imaging System

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

Issue:
2006年01期
Page:
85-88
Research Field:
Publishing date:
2006-02-28

Info

Title:
Bias Voltage Numerical Analysis of Uncooled Thermal Imaging System
Author(s):
XING Su-xia1 2 ZHANG Jun- ju1 SUN Lian- jun1 CHANG Ben-kang1 QIAN Yun-sheng1
1. School of Electronic Engineering and Optoelectronic Technology,NUST, Nanjing 210094, China; 2. School of Information Engineering, Beijing Technology and Business University, Beijing 100037, China
Keywords:
thermal imaging bias voltage noise equivalent temperature difference quality factor
PACS:
TN219
DOI:
-
Abstract:
Based on the theoret ical analysis of a microbolometer, the relationship of the bias voltage with noise, noise equivalent temperature difference ( NETD) and detectivity D* was discussed by a numerical calculation method. The best bias voltage of microbolometer ranges from 1. 0 to 4. 0 V, between which the NETD ranges from 67. 7 to 41. 1mK, the detectivity ( D* ) ranges from 6. 1 @ 109 to 1. 15 @ 1010 cmHz1/ 2/ W , and the quality factor ( Q ) ranges from 1. 5 to 1. 21. In the 110 to 410 V bias voltage ranges, the detector. s performance can be opt imized.

References:

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Memo

Memo:
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Last Update: 2006-02-28