|Table of Contents|

Method to rigorously solute sub-wavelength slit diffraction

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

Issue:
2013年03期
Page:
41-
Research Field:
Publishing date:

Info

Title:
Method to rigorously solute sub-wavelength slit diffraction
Author(s):
Yan Li1Li Jianlong2
1.Jiangsu Testing Institute of Product Quality Supervision,Nanjing 210007,China; 2.College of Nuclear Science and Engineering,Sichuan University,Chengdu 610065,China
Keywords:
rigorous electromagnetic field theory semi-analytical method sub-wavelength slit diffraction
PACS:
N34
DOI:
-
Abstract:
A semi-analytical method based on rigorous electromagnetic field theory to rigorously solute the slit diffraction is presented here,and some expressions of the diffraction field in the double-slit are also given.Numerical calculation results show that the optical maximum intensities in the field of the slit diffraction are located at the slit structure,and the spatial distribution of the diffraction field varies and the number of these optical maximum intensities increases with the increase of the transmission depth.This method presented here can be applied to analyze the propagation of the beam diffracted by some micro-nano optical components.

References:

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Last Update: 2013-03-25