[1]姜仁元,张兴唐,杨亦春.温度应力下功能退化型加速寿命试验问题研究[J].南京理工大学学报(自然科学版),2000,(06):523-527.
 JiangRenyuan ZhangXingtang YangYichun.Study on Accelerated Life Test of Function Degenerating Type by Temperature Stress[J].Journal of Nanjing University of Science and Technology,2000,(06):523-527.
点击复制

温度应力下功能退化型加速寿命试验问题研究()
分享到:

《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

卷:
期数:
2000年06期
页码:
523-527
栏目:
出版日期:
2000-12-30

文章信息/Info

Title:
Study on Accelerated Life Test of Function Degenerating Type by Temperature Stress
作者:
姜仁元张兴唐杨亦春
南京理工大学机械学院, 南京210094
Author(s):
JiangRenyuan ZhangXingtang YangYichun
School of Mechanics,NUST,Nanjing 210094
关键词:
失效机理 加速寿命试验 仿真
Keywords:
failure mechanism accelerated life test simulation
分类号:
TJ430
摘要:
该文针对研究无线电引信长期贮存可靠性 ,根据电子元器件参数随贮存时间变化的规律 ,确定并建立温度为应力的功能退化型加速寿命试验模型。根据加速寿命试验结果推出一般状态下电子元器件的性能变化规律 ,通过阿伦尼斯模型推导出加速寿命系数。该文还对加速系数和激活能进行了进一步讨论 ,并就线性规律、指数规律和幂函数规律等几种常见的功能退化规律 ,推导出加速系数和激活能计算公式 ,并通过实例计算出产品的综合激活能
Abstract:
This paper studied reliability of radio fuze for long t ime storage. Because parameters of electronic component are changed w ith storage time, the funct ion degenerat ing type accelerated life test model is established and built by temperature st ress. According to the result of accelerated life test, the performance variation law of electronic components in common cond-i t ion is deduced, and the accelerated life factor is derived f rom Arrhenius model. Furthermore, this paper studied accelerated factor and act ivat ion energy, deduced accelerated factor and calculat ional formula of activat ion energy by several kinds of familiar funct ion degenerat ing law such as linear function, ex ponent ial function and idempotent funct ion, and then calculated the product ion. s integrated act ivat ion energy by example.

参考文献/References:

1 [ 日] 盐见·弘. 失效物理基础. 杨家铿译. 北京: 科学出版社, 1982
2 胡昌寿. 可靠性工程设计——试验、分析、管理. 北京: 宇航出版社, 1989
3 周源泉. 论加速系数与失效机理不变的条件( Ⅳ) ——寿命型随机变量的情况. 系统工程与电子技术, 1996( 1) : 55~ 66

备注/Memo

备注/Memo:
姜仁元 男 58 岁 副教授
更新日期/Last Update: 2013-03-25