[1]蒋立平,谭雪琴.多线冗余电路分析[J].南京理工大学学报(自然科学版),2005,(01):40-42.
 JIANG Li-ping,TAN Xue-qin.Analysis of Multiple-line Redundant Circuits[J].Journal of Nanjing University of Science and Technology,2005,(01):40-42.
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多线冗余电路分析
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《南京理工大学学报》(自然科学版)[ISSN:1005-9830/CN:32-1397/N]

卷:
期数:
2005年01期
页码:
40-42
栏目:
出版日期:
2005-02-28

文章信息/Info

Title:
Analysis of Multiple-line Redundant Circuits
作者:
蒋立平谭雪琴
南京理工大学电子工程与光电技术学院, 江苏南京210094
Author(s):
JIANG Li-ping TAN Xue-qin
School of Electronic Engineering and Photoelectronic Technology, NUST, Nanjing 210094,China
关键词:
组合电路 多线冗余 故障检测
Keywords:
comb inational circuits mu ltiple-line redundancy fault detection
分类号:
TN702
摘要:
该文在简单介绍多线冗余概念及常用定理的基础上,对多线冗余问题进行研究,提出了一种能构造任意多线冗余电路的方法,并进一步讨论了这种多线冗余电路的可测试性问题。所构造的电路具有这样的特点:电路本身是多线冗余的,而该电路的子网络却是无冗余的;任何小于k重的固定电平故障均可以检测。
Abstract:
The redundancy caused by incorrect c ircu it design causes the increase o f c ircu it cos.t A lso, it makes fault detect ion of netwo rk diff icu lt or impossib le. The know ledge onmultiple-line redundancy is introduced. Then, ame thod to create arbitrarymultiple-line redundant c ircuit is proposed. The created c ircu it has one characterist ic, that is, the circu it itself ismu ltiple-line redundancy but its subnet is irredundan. t Any f ixed leve l fault wh ich is less than k-tuple is detectable

参考文献/References:

[ 1] Ne lson V P, T roy N ag le H, Carro ll B D, e t a.l D ig ita l log ic c ircu it ana lys is and design [M ]. [ S. L. ] : Prentice- H all Interna tiona ,l Inc 1995.
[ 2] Cheng K T, Entrena L A. Mu lt-i level log ic optim iza tion by redundancy add ition and remova l [ A] . European Confe rence on Design Autom ation [ C ]. [ S. L. ]: EDAC-93 IEEE, 1993: 373- 377.
[ 3] 周南良. 数字逻辑[M ]. 长沙: 国防科技大学出版社, 1993.

备注/Memo

备注/Memo:
作者简介: 蒋立平( 1955 - ), 男, 江苏常州人, 教授, 主要研究方向: 电子技术的教学和理论研究, E-m a il: jiang lp@126. com。
更新日期/Last Update: 2013-03-03